Details

Materials Characterization


Materials Characterization

Introduction to Microscopic and Spectroscopic Methods
2. Aufl.

von: Yang Leng

84,99 €

Verlag: Wiley-VCH
Format: PDF
Veröffentl.: 26.07.2013
ISBN/EAN: 9783527670802
Sprache: englisch
Anzahl Seiten: 392

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Beschreibungen

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
LIGHT MICROSCOPY Optical Principles Instrumentation Specimen Preparation Imaging Modes Confocal Microscopy Questions X-RAY DIFFRACTION METHODS X-ray Radiation Theoretical Background of Diffraction X-ray Diffractometry Wide Angle X-ray Diffraction and Scattering Questions TRANSMISSION ELECTRON MICROSCOPY Instrumentation Specimen Preparation Image Modes Selected Area Diffraction Images of Crystal Defects Questions SCANNING ELECTRON MICROSCOPY Instrumentation Contrast Formation Operational Variables Specimen Preparation Questions SCANNING PROBE MICROSCOPY Instrumentation Scanning Tunneling Microscopy Atomic Force Microscopy Image Artifacts Questions X-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSIS Features of Characteristic X-rays X-ray Fluorescence Spectrometry Energy Dispersive Spectroscopy in Electron Microscopes Qualitative and Quantitative Analysis Questions ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS Basic Principles Instrumentation Characteristics of Electron Spectra Qualitative and Quantitative Analysis Questions SECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSIS Basic Principles Instrumentation Surface Structure Analysis SIMS Imaging SIMS Depth Profiling Questions VIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSIS Theoretical Background Fourier Transform Infrared Spectroscopy Raman Microscopy Interpretation of Vibrational Spectra Questions THERMAL ANALYSIS Common Characteristics Differential Thermal Analysis and Differential Scanning Calorimetry Thermogravimetry Questions
Yang Leng is Professor, specialized in materials science and engineering, at The Hong Kong University of Science and Technology (HKUST). His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has extensively published in international journals. In addition, he has actively engaged in industrial consultancy. His contribution to teaching materials science and engineering is exemplified by the Teaching Excellence Appreciation award from the HKUST.
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

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