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Introduction to Spectroscopic Ellipsometry of Thin Film Materials


Introduction to Spectroscopic Ellipsometry of Thin Film Materials

Instrumentation, Data Analysis, and Applications
1. Aufl.

von: Andrew Thye Shen Wee, Xinmao Yin, Chi Sin Tang

84,99 €

Verlag: Wiley-VCH
Format: PDF
Veröffentl.: 08.03.2022
ISBN/EAN: 9783527833948
Sprache: englisch
Anzahl Seiten: 208

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Beschreibungen

<p><b>A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization</b> <p>In <i>Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications</i>, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. <p>The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: <ul> <li>Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites</li> <li>Comprehensive explorations of two-dimensional transition metal dichalcogenides</li> <li>Practical discussions of single layer graphene systems and nickelate systems</li> <li>In-depth examinations of potential future developments and applications of spectroscopic ellipsometry</li></ul><p>Perfect for master’s- and PhD-level students in physics and chemistry, <i>Introduction to Spectroscopic Ellipsometry of Thin Film Materials </i>will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
1 SPECTROSCOPIC ELLIPSOMETRY: BASIC PRINCIPLES<br> 1.1 Introduction<br> 1.2 Polarization of Light<br> 1.3 Features of Spectroscopic Ellipsometry <br> 1.4 Experimental Set Up<br> 1.5 Data Analysis<br> <br> 2 STRONGLY CORRELATED SYSTEMS: CUPRATES & MANGANITES<br> 2.1 An Introduction<br> 2.1.1 Crystal Structures<br> 2.1.2 Arising Electronic Structures<br> 2.1.3 Superconductivity<br> 2.1.4 Colossal Magnetoresistance <br> 2.2 Strong and Weak Correlations in Ambipolar cuprate thin-film systems<br> 2.3 Charge localization in Cuprate thin film on oxide substrate<br> 2.4 Jahn-Teller splitting energy control the phase transition in manganite thin-film systems<br> 2.5 Plasmon and high-energy exciton excitations in cuprates thin-films<br> <br> 3 2D TRANSITION METAL DICHALCOGENIDES <br> 3.1 An Introduction<br> 3.1.1 Crystal Structures of 2D-TMDs<br> 3.1.2 Arising Electronic Structures <br> 3.2 Ellipsometry in Probing structural phase transition and electronic structures monolayer-MoS2 <br> 3.3 Three-Dimensional Resonant Exciton in monolayer-WSe2<br> 3.4 Examining Interfacial Effects: High-energy excitons in Strontium Titanate and interfaces (manganite, MoS2)<br> 3.5 Anisotropic plasmon excitations in quasi-metallic 2D-TMDs<br> <br> 4 GRAPHENE <br> 4.1 An introduction<br> 4.1.1 Crystal structure of graphene<br> 4.1.2 Arising Electronic structures<br> 4.2 Probing optical structures and many-body effects in Graphene<br> 4.3 High-energy features and quasi-particle dynamics in Graphene<br> <br> 5 NICKELATE PEROVSKITE SYSTEMS<br> 5.1 An Introduction<br> 5.1.1 Electronic and Crystal Structures<br> 5.1.2 Magnetic orders of Nickelate systems<br> 5.2 Metal-Insulator Transition of Rare-earth Nickelates<br> 5.3 Magnetic induction induced by Interfacial hybridization<br> <br> 6 OUTLOOK OF SPECTROSCOPIC ELLIPSOMETRY OF NOVEL MATERIALS<br> 6.1 Future Development of Spectroscopic Ellipsometry<br> 6.2 Development of Novel Materials and the Relevance of Spectroscopic Ellipsometry<br> <br> <br>
<p><b><i>Andrew T.S. Wee, DPhil,</b> is Professor of Physics and Director of the Surface Science Laboratory at the National University of Singapore (NUS). His research is focused on surface and nanoscale science, scanning tunnelling microscopy, and synchrotron radiation studies of the molecule-substrate interface.</i></p> <p><i><b>Xinmao Yin, PhD, </b>is Professor of Physics at the Shanghai University, China. His research is focused on quantum materials and broad energy range optical spectroscopic techniques.</i> <p><i><b>Chi Sin Tang</b> is scientist at the Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), Singapore. His research is focused on the electronic and optical properties of low-dimensional materials.</i>
<p><b>A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization</b></p> <p>In <i>Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications, </i>a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. <p>The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: <ul><li>Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites</li> <li>Comprehensive explorations of two-dimensional transition metal dichalcogenides</li> <li>Practical discussions of single layer graphene systems and nickelate systems</li> <li>In-depth examinations of potential future developments and applications of spectroscopic ellipsometry</li></ul> <p>Perfect for master’s- and PhD-level students in physics and chemistry,<i> Introduction to Spectroscopic Ellipsometry of Thin Film Materials</i> will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

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