Details

PART I. Introduction<br /><br /> INTRODUCTION TO THIN-FILM PHOTOVOLTAICS<br /> Introduction<br /> The Photovoltaic Principle<br /> Functional Layers in Thin-Film Solar Cells<br /> Comjparison of Various Thin-Film Solar-Cell Types<br /> Conclusions<br /><br /> PART II. Device Characterization<br /><br /> FUNDAMENTAL ELECTRICAL CHARACTERIZATIONS OF THIN-FILM SOLAR CELLS<br /> Introduction<br /> Current/Voltage Curves<br /> Quantum-Efficiency Measurements<br /><br /> ELECTROLUMINESCENCE ANALYSIS OF SOLAR CELLS AND SOLAR MODULES<br /> Introduction<br /> Basics<br /> Spectrally Resolved EL<br /> Spatially Resolved EL of c-Si Solar Cells<br /> EL Imaging of Thin-Film Solar Cells and Modules<br /> Electromodulated Luminescence under Illumination<br /><br /> CAPACITANCE SPECTROSCOPY OF THIN-FILM SOLAR CELLS<br /> Introduction<br /> Admittance Basics<br /> Sample Requirements<br /> Instrumentation<br /> CV Profiling and the Depletion Approximation<br /> Admittance Response of Deep States<br /> The Influence of Deep States on CV Profiles<br /> Deep-Level Transient Spectroscopy<br /> Admittance Spectroscopy<br /> Drive-Level Capacitance Profiling<br /> Photocapacitance<br /> The Meyer-Neldel Rule<br /> Spatial Inhomogeneities and Interface States<br /> Metastability<br /><br /> TIME-OF-FLIGHT ANALYSIS<br /> Introduction<br /> Fundamentals of TOF Measurements<br /> Experimental Details<br /> Analysis of TOF Results<br /><br /> TRANSIENT OPTOELECTRONIC CHARACTERIZATION OF THIN-FILM SOLAR CELLS<br /> Introduction<br /> Measurement Setup<br /> Charge Extraction and Transient Photovoltage<br /> CE with Linearly Increased Voltage<br /> Time-Delayed Collection Field Method<br /><br /> STEADY-STATE PHOTOCARRIER GRATING METHOD<br /> Introduction<br /> Basic Analysis of SSPG and Photocurrent Response<br /> Experimental Setup<br /> Data Analysis<br /> Results<br /> DOS Determination<br /> Data Collection by Automization and Combination with other Experiments<br /> Summary<br /><br /> PART III. Materials Characterization<br /><br /> ABSORPTION AND PHOTOCURRENT SPECTROSCOPY WITH HIGH DYNAMIC RANGE<br /> Introduction<br /> Photothermal Deflection Spectroscopy<br /> Fourier Transform Photocurrent Spectroscopy<br /><br /> SPECTROSCOPIC ELLIPSOMETRY<br /> Introduction<br /> Theory<br /> Ellipsometry Instrumentation<br /> Data Analysis<br /> Spectroscopic Ellipsometry forThin-Film Photovoltaics<br /> Summary and Outlook<br /><br /> CHARACTERIZING THE LIGHT-TRAPPING PROPERTIES OF TEXTURED SURFACES WITH SCANNING NEAR-FIELD OPTICAL MICROSCOPY<br /> Introduction<br /> How Does a Scanning Near-Field Optical Microscope Work?<br /> The Role of Evanescent Modes for Light Trapping<br /> Analysis of Scanning Near-Field Optical Microscopy Images by Fast Fourier Transformation<br /> Investigation of Individua lWaveguide Modes<br /> Light Propagation inThin-Film Solar Cells Investigated with Dual-Probe SNOM<br /> Conclusion<br /><br /> PHOTOLUMINESCENCE ANALYSIS OF THIN-FILM SOLAR CELLS<br /> Introduction<br /> Experimental Issues<br /> Basic Transitions<br /> Case Studies<br /><br /> ELECTRON-SPIN RESONANCE (ESR) IN HYDROGENATED AMORPHOUS SILICON (a-Si:H)<br /> Introduction<br /> Basics of ESR<br /> How to Measure ESR<br /> The g Tensor and Hyperfine Interaction in Disordered Solids<br /> Discussion of Selected Results<br /> Alternative ESR Detection<br /> Concluding Remarks<br /><br /> SCANNING PROBE MICROSCOPY ON INORGANIC THIN FILMS FOR SOLAR CELLS<br /> Introduction<br /> Experimental Background<br /> Selected Applications<br /> Summary<br /><br /> ELECTRON MICROSCOPY ON THIN FILMS FOR SOLAR CELLS<br /> Introduction<br /> Scanning Electron Microscopy<br /> Transmission Electron Microscopy<br /> Sample Preparation Techniques<br /><br /> X-RAY AND NEUTRON DIFFRACTION ON MATERIALS FOR THIN-FILM SOLAR CELLS<br /> Introduction<br /> Diffraction of X-Rays and Neutron by Matter<br /> Grazing Incidence X-Ray Diffraction (GIXRD)<br /> Neutron Diffraction of Absorber Materials for Thin-Film Solar Cells<br /> Anomalous Scattering of Synchrotron X-Rays<br /><br /> IN SITU REAL-TIME CHARACTERIZATION OF THIN-FILM GROWTH<br /> Introduction<br /> Real-Time In Situ Characterization Techniques for Thin-Film Growth<br /> X-Ray Methods for Real-Time Growth Analysis<br /> Light Scattering and Reflection<br /> Summary<br /><br /> RAMAN-SPECTROSCOPY ON THIN FILMS FOR SOLAR CELLS<br /> Introduction<br /> Fundamentals of Raman Spectroscopy<br /> Vibrational Modes in Crystalline Materials<br /> Experimental Considerations<br /> Characterization of Thin-Film Photovoltaic Materials<br /> Conclusions<br /><br /> SOFT X-RAY AND ELECTRON SPECTROSCOPY: A UNIQUE "TOOL CHEST" TO CHARACTERIZE THE CHEMICAL AND ELECTRONIC PROPERTIES OF SURFACES AND INTERFACES<br /> Introduction<br /> Charact

<p><b>Daniel Abou-Ras</b> is senior scientist at the Helmholtz Center Berlin for Materials and Energy, Germany. He obtained his PhD at ETH Zurich, Switzerland. In 2005, he was awarded the MRS Graduate Student Gold Award at the MRS Spring Meeting. His research interests are correlative approaches in scanning as well as transmission electron microscopy, mainly applied on semiconductor devices.</p> <p><b>Thomas Kirchartz</b> is professor in the Department of Electrical Engineering and Information Technology at the University Duisburg-Essen and head of the Division for Organic and Hybrid Solar Cells at the Institute of Energy and Climate Research 5 - Photovoltaics at the Research Center Julich, Germany. Previously he was Junior Research Fellow in the Department of Physics at Imperial College London, UK. He obtained his degree in Electrical Engineering and Information Technology from the University of Stuttgart, Germany, in 2006 and his PhD from the RWTH Aachen, Germany, in 2009.</p> <p><b>Uwe Rau</b> is full professor at the Faculty Electrical Engineering and Computer Science of the RWTH Aachen, Germany, since 2007 and head of the Institute of Energy and Climate Research 5 - Photovoltaics at the Research Center Julich, Germany. He obtained his PhD 1991 from the University Tubingen and was scientific group leader from 1995-2007 at the Universities of Bayreuth and Stuttgart.</p>

DE