<p>Preface xiii</p> <p><b>1. Introduction 1</b></p> <p>1.1 X-Ray Technology, a Brief History, 1</p> <p>1.2 Geometry of Crystals, 2</p> <p>1.3 Principles of X-Ray Diffraction, 11</p> <p>1.4 Reciprocal Space and Diffraction, 13</p> <p>1.5 Two-Dimensional X-Ray Diffraction, 19</p> <p>References, 26</p> <p><b>2. Geometry and Fundamentals 29</b></p> <p>2.1 Introduction, 29</p> <p>2.2 Diffraction Space and Laboratory Coordinates, 31</p> <p>2.3 Detector Space and Detector Geometry, 35</p> <p>2.4 Sample Space and Goniometer Geometry, 46</p> <p>2.5 Transformation from Diffraction Space to Sample Space, 50</p> <p>2.6 Reciprocal Space, 52</p> <p>2.7 Summary, 53</p> <p>References, 55</p> <p><b>3. X-Ray Source and Optics 57</b></p> <p>3.2 X-Ray Optics, 63</p> <p>References, 85</p> <p><b>4. X-Ray Detectors 87</b></p> <p>4.1 History of X-Ray Detection Technology, 87</p> <p>4.2 Point Detectors in Conventional Diffractometers, 89</p> <p>4.3 Characteristics of Point Detectors, 92</p> <p>4.4 Line Detectors, 100</p> <p>4.5 Characteristics of Area Detectors, 107</p> <p>4.6 Types of Area Detectors, 119</p> <p>References, 137</p> <p><b>5. Goniometer and Sample Stages 141</b></p> <p>5.1 Goniometer and Sample Position, 141</p> <p>5.2 Goniometer Accuracy, 145</p> <p>5.3 Sample Alignment and Visualization Systems, 149</p> <p>5.4 Environment Stages, 151</p> <p>References, 155</p> <p><b>6. Data Treatment 157</b></p> <p>6.1 Introduction, 157</p> <p>6.2 Non-Uniform Response Correction, 157</p> <p>6.3 Spatial Correction, 161</p> <p>6.4 Detector Position Accuracy and Calibration, 166</p> <p>6.5 Frame Integration, 177</p> <p>6.6 Multiple Frame Merge, 186</p> <p>6.7 Scanning 2D Pattern, 194</p> <p>6.8 Lorentz, Polarization, and Absorption Corrections, 197</p> <p>References, 208</p> <p><b>7. Phase Identification 211</b></p> <p>7.1 Introduction, 211</p> <p>7.2 Relative Intensity, 212</p> <p>7.3 Geometry and Resolution, 216</p> <p>7.4 Sampling Statistics, 221</p> <p>7.5 Preferred Orientation Effect, 227</p> <p>References, 233</p> <p><b>8. Texture Analysis 235</b></p> <p>8.1 Introduction, 235</p> <p>8.2 Pole Density and Pole-Figure, 236</p> <p>8.3 Fundamental Equations, 238</p> <p>8.4 Data Collection Strategy, 242</p> <p>8.5 Texture Data Process, 251</p> <p>8.6 Orientation Distribution Function, 256</p> <p>8.7 Fiber Texture, 261</p> <p>8.8 Polymer Texture, 264</p> <p>8.9 Other Advantages of XRD2 for Texture, 268</p> <p>References, 269</p> <p><b>9. Stress Measurement 271</b></p> <p>9.1 Introduction, 271</p> <p>9.2 Principle of X-ray Stress Analysis, 280</p> <p>9.3 Theory of Stress Analysis with XRD2, 292</p> <p>9.4 Process of Stress Measurement with XRD2, 307</p> <p>9.5 Experimental Examples, 325</p> <p>A9.1 Calculate Principal Stresses, 349</p> <p>A9.2 Calculate the direction cosines for principal stresses (Eigenvectors), 350</p> <p>References, 353</p> <p><b>10. Small Angle X-ray Scattering 357</b></p> <p>10.1 Introduction, 357</p> <p>10.2 2D SAXS Systems, 361</p> <p>10.3 Applications Examples, 367</p> <p>10.4 Some Innovations in 2D SAXS, 370</p> <p>References, 374</p> <p><b>11. Combinatorial Screening 379</b></p> <p>11.1 Introduction, 379</p> <p>11.2 XRD2 Systems for High Throughput Screening, 380</p> <p>11.3 Combined Screening with XRD2 and Raman, 390</p> <p>Reference, 393</p> <p><b>12. Miscellaneous Applications 395</b></p> <p>12.1 Percent Crystallinity, 395</p> <p>12.2 Crystal Size, 402</p> <p>12.3 Retained Austenite, 412</p> <p>12.4 Crystal Orientation, 414</p> <p>12.5 Thin Film Analysis, 418</p> <p>Reference, 429</p> <p><b>13. Innovation and Future Development 433</b></p> <p>13.1 Introduction, 433</p> <p>13.2 Scanning Line Detector for XRD2, 434</p> <p>13.3 Three-Dimensional Detector, 438</p> <p>13.4 Pixel Direct Diffraction Analysis, 441</p> <p>13.5 High Resolution Two-Dimensional X-Ray Diffractometer, 444</p> <p>References, 451</p> <p>Appendix A. Values of Commonly Used Parameters 453</p> <p>Appendix B. Symbols 459</p> <p>Index 465</p>