The second edition of this successful machine vision textbook is completely updated, revised and expanded by 15% to reflect the developments of recent years in the fields of image acquisition, machine vision algorithms and applications. The new content includes, but is not limited to, a discussion of new cameras and image acquisition interfaces, 3D sensors and technologies, 3D object recognition and 3D image reconstruction. The authors retain their balanced approach with sufficient coverage of the theory and a strong focus on applications. All examples are based on the latest version of the machine vision software HALCON 13, a trial version of which is available from the authors' website.
INTRODUCTION IMAGE ACQUISITION Illumination Lenses Cameras Camera-Computer Interfaces MACHINE VISION ALGORITHMS Fundamental Data Structures Image Enhancement Geometric Transformations Image Segmentation Feature Extraction Morphology Edge Extraction Segmentation and Fitting of Geometric Primitives Camera Calibration Stereo Reconstruction Template Matching Optical Character Recognition MACHINE VISION APPLICATIONS Wafer Dicing Reading of Serial Numbers Inspection of Saw Blades Print Inspection Inspection of Ball Grid Arrays Surface Inspection Measuring of Spark Plugs Molding Flash Detection Inspection of Punched Sheets 3D Plane Reconstruction with Stereo Pose Verification and Resistors Classification of Non-Woven Fabrics
Carsten Steger studied computer science at Technische Universitat Munchen (TUM) and received his PhD from TUM in 1998. In 1996, he co-founded the company MVTec, where he heads the Research and Development department. He has authored and co-authored more than 60 scientific publications in the field of machine vision. Carsten Steger is also a guest lecturer at the Technische Universitat Munchen, where he teaches machine vision. Markus Ulrich studied Geodesy and Remote Sensing at Technische Universitat Munchen (TUM) and received his PhD from TUM in 2003. Since 2003, he is a software engineer at the Research and Development department of MVTec. He has authored and co-authored scientific publications in the fields of photogrammetry and machine vision. Markus Ulrich is also a guest lecturer at the Technische Universitat Munchen, where he teaches close-range photogrammetry. Christian Wiedemann studied Geodesy and Remote Sensing at Technische Universitat Munchen (TUM) and received his PhD from TUM in 2001. He has authored and co-authored more than 40 scientific publications in the fields of photogrammetry, remote sensing, and machine vision. Since 2003, he is a software engineer at the Research and Development department of MVTec.
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