Details

Experimental Mechanics of Solids


Experimental Mechanics of Solids


1. Aufl.

von: Cesar A. Sciammarella, Federico M. Sciammarella

189,99 €

Verlag: Wiley
Format: PDF
Veröffentl.: 28.02.2012
ISBN/EAN: 9781119994084
Sprache: englisch
Anzahl Seiten: 768

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Beschreibungen

Experimental solid mechanics is the study of materials to determine their physical properties. This study might include performing a stress analysis or measuring the extent of displacement, shape, strain and stress which a material suffers under controlled conditions. In the last few years there have been remarkable developments in experimental techniques that measure shape, displacement and strains and these sorts of experiments are increasingly conducted using computational techniques. <p><i>Experimental Mechanics of Solids</i> is a comprehensive introduction to the topics, technologies and methods of experimental mechanics of solids. It begins by establishing the fundamentals of continuum mechanics, explaining key areas such as the equations used, stresses and strains, and two and three dimensional problems. Having laid down the foundations of the topic, the book then moves on to look at specific techniques and technologies with emphasis on the most recent developments such as optics and image processing. Most of the current computational methods, as well as practical ones, are included to ensure that the book provides information essential to the reader in practical or research applications.</p> <p>Key features:</p> <ul> <li>Presents widely used and accepted methodologies that are based on research and development work of the lead author</li> <li>Systematically works through the topics and theories of experimental mechanics including detailed treatments of the Moire, Speckle and holographic optical methods</li> <li>Includes illustrations and diagrams to illuminate the topic clearly for the reader</li> <li>Provides a comprehensive introduction to the topic, and also acts as a quick reference guide</li> </ul> <p>This comprehensive book forms an invaluable resource for graduate students and is also a point of reference for researchers and practitioners in structural and materials engineering.</p>
<b>About the Authors xvii</b> <p><b>Preface xix</b></p> <p><b>Foreword xxi</b></p> <p><b>1 Continuum Mechanics – Historical Background 1</b></p> <p>1.1 Definition of the Concept of Stress 4</p> <p>1.2 Transformation of Coordinates 5</p> <p>1.3 Stress Tensor Representation 6</p> <p>1.4 Principal Stresses 8</p> <p>1.5 Principal Stresses in Two Dimensions 10</p> <p>1.6 The Equations of Equilibrium 11</p> <p>1.7 Strain Tensor 13</p> <p>1.8 Stress – Strain Relations 15</p> <p>1.9 Equations of Compatibility 18</p> <p>References 19</p> <p><b>2 Theoretical Stress Analysis – Basic Formulation of Continuum Mechanics. Theory of Elasticity 21</b></p> <p>2.1 Introduction 21</p> <p>2.2 Fundamental Assumptions 21</p> <p>2.3 General Problem 22</p> <p>2.4 St. Venant’s Principle 25</p> <p>2.5 Plane Stress, Plane Strain 28</p> <p>2.6 Plane Stress Solution of a Simply Supported Beam with a Uniform Load 30</p> <p>2.7 Solutions in Plane Strain and in Plane Stress 33</p> <p>2.8 The Plane Problem in Polar Coordinates 35</p> <p>2.9 Thick Wall Cylinders 36</p> <p>References 39</p> <p><b>3 Strain Gages – Introduction to Electrical Strain Gages 41</b></p> <p>3.1 Strain Measurements – Point Methods 41</p> <p>3.2 Electrical Strain Gages 42</p> <p>3.3 Basics of Electrical Strain Gages 43</p> <p>3.4 Gage Factor 45</p> <p>3.5 Basic Characteristics of Electrical Strain Gages 48</p> <p>3.6 Errors Due to the Transverse Sensitivity 54</p> <p>3.7 Errors Due to Misalignment of Strain Gages 58</p> <p>3.8 Reinforcing Effect of the Gage 60</p> <p>3.9 Effect of the Resistance to Ground 61</p> <p>3.10 Linearity of the Gages. Hysteresis 63</p> <p>3.11 Maximum Deformations 64</p> <p>3.12 Stability in Time 64</p> <p>3.13 Heat Generation and Dissipation 64</p> <p>3.14 Effect of External Ambient Pressure 65</p> <p>3.15 Dynamic Effects 67</p> <p>References 71</p> <p><b>4 Strain Gages Instrumentation – TheWheatstone Bridge 75</b></p> <p>4.1 Introduction 75</p> <p>References 109</p> <p><b>5 Strain Gage Rosettes: Selection, Application and Data Reduction 111</b></p> <p>5.1 Introduction 111</p> <p>5.2 Errors, Corrections, and Limitations for Rosettes 119</p> <p>5.3 Applications of Gages to Load Cells 119</p> <p>References 121</p> <p><b>6 Optical Methods – Introduction 123</b></p> <p>6.1 Historical Perspective and Overview 123</p> <p>6.2 Fundamental Basic Definitions of Optics 127</p> <p>6.3 The Electromagnetic Theory of Light 128</p> <p>6.4 Properties of Polarized Light 137</p> <p>6.5 The Jones Vector Representation 138</p> <p>6.6 Light Intensity 141</p> <p>6.7 Refraction of the Light 141</p> <p>6.8 Geometrical Optics. Lenses and Mirrors 146</p> <p>References 154</p> <p><b>7 Optical Methods – Interference and Diffraction of Light 155</b></p> <p>7.1 Connecting Light Interference with Basic Optical Concepts 155</p> <p>7.2 Light Sources 155</p> <p>7.3 Interference 161</p> <p>7.4 Interferometers 166</p> <p>7.5 Diffraction of the Light 171</p> <p>References 181</p> <p><b>8 Optical Methods – Fourier Transform 183</b></p> <p>8.1 Introduction 183</p> <p>8.2 Simple Properties 185</p> <p>8.3 Transition to Two Dimensions 187</p> <p>8.4 Special Functions 188</p> <p>8.5 Applications to Diffraction Problems 191</p> <p>8.6 Diffraction Patterns of Gratings 193</p> <p>8.7 Angular Spectrum 195</p> <p>8.8 Utilization of the FT in the Analysis of Diffraction Gratings 199</p> <p>References 205</p> <p><b>9 Optical Methods – Computer Vision 207</b></p> <p>9.1 Introduction 207</p> <p>9.2 Study of Lens Systems 208</p> <p>9.3 Lens System, Coordinate Axis and Basic Layout 210</p> <p>9.4 Diffraction Effect on Images 211</p> <p>9.5 Analysis of the Derived Pupil Equations for Coherent Illumination 216</p> <p>9.6 Imaging with Incoherent Illumination 217</p> <p>9.7 Digital Cameras 230</p> <p>9.8 Illumination Systems 242</p> <p>9.9 Imaging Processing Systems 245</p> <p>9.10 Getting High Quality Images 246</p> <p>References 249</p> <p><b>10 Optical Methods – Discrete Fourier Transform 251</b></p> <p>10.1 Extension to Two Dimensions 253</p> <p>10.2 The Whittaker-Shannon Theorem 257</p> <p>10.3 General Representation of the Signals Subjected to Analysis 261</p> <p>10.4 Computation of the Phase of the Fringes 271</p> <p>10.5 Fringe Patterns Singularities 276</p> <p>10.6 Extension of the Fringes beyond Boundaries 279</p> <p>References 283</p> <p><b>11 Photoelasticity – Introduction 285</b></p> <p>11.1 Introduction 285</p> <p>11.2 Derivation of the Fundamental Equations 286</p> <p>11.3 Wave Plates 291</p> <p>11.4 Polarizers 293</p> <p>11.5 Instrument Matrices 294</p> <p>11.6 Polariscopes 296</p> <p>11.7 Artificial Birefringence 304</p> <p>11.8 Polariscopes 307</p> <p>11.9 Equations of the Intensities of the Plane Polariscope and the Circular Polariscope for a Stressed Plate 309</p> <p>References 311</p> <p><b>12 Photoelasticity Applications 313</b></p> <p>12.1 Calibration Procedures of a Photoelastic Material 313</p> <p>12.2 Interpretation of the Fringe Patterns 319</p> <p>12.3 Determination of the Fringe Order 319</p> <p>12.4 Relationship between Retardation Changes of Path and Sign of the Stress Differences 327</p> <p>12.5 Isoclinics and Lines of Principal Stress Trajectories 328</p> <p>12.6 Utilization of White Light in Photoelasticity 333</p> <p>12.7 Determination of the Sign of the Boundary Stresses 338</p> <p>12.8 Phase Stepping Techniques 342</p> <p>12.9 RGB Photoelasticity 343</p> <p>12.10 Reflection Photoelasticity 355</p> <p>12.11 Full Field Analysis 364</p> <p>12.12 Three Dimensional Analysis 366</p> <p>12.13 Integrated Photoelasticity 375</p> <p>12.14 Dynamic Photoelasticity 380</p> <p>References 383</p> <p><b>13 Techniques that Measure Displacements 387</b></p> <p>13.1 Introduction 387</p> <p>13.2 Formation of Moir´e Patterns. One Dimensional Case 388</p> <p>13.3 Formation of Moir´e Patterns. Two Dimensional Case 390</p> <p>13.4 Relationship of the Displacement Vector and the Strain Tensor Components 393</p> <p>13.5 Properties of the Moire Fringes (Isothetic Lines) 395</p> <p>13.6 Sections of the Surface of Projected Displacements 396</p> <p>13.7 Singular Points and Singular Lines 401</p> <p>13.8 Digital Moir´e 402</p> <p>13.9 Equipment Required to Apply the Moir´e Method for Displacement and Strain Determination Utilizing Incoherent Illumination 412</p> <p>13.10 Strain Analysis at the Sub-Micrometer Scale 419</p> <p>13.11 Three Dimensional Moir´e 424</p> <p>13.12 Dynamic Moir´e 426</p> <p>References 432</p> <p><b>14 Moir´e Method. Coherent Ilumination 435</b></p> <p>14.1 Introduction 435</p> <p>14.2 Moir´e Interferometry 435</p> <p>14.3 Optical Developments to Obtain Displacement, Contours and Strain Information 439</p> <p>14.4 Determination of All the Components of the Displacement Vector 3-D Interferometric Moir´e 446</p> <p>14.5 Application of Moir´e Interferometry to High Temperature Fracture Analysis 451</p> <p>References 456</p> <p><b>15 Shadow Moir´e & Projection Moir´e – The Basic Relationships 459</b></p> <p>15.1 Introduction 459</p> <p>15.2 Basic Equation of Shadow Moir´e 460</p> <p>15.3 Basic Differential Geometry Properties of Surfaces 461</p> <p>15.4 Connection between Differential Geometry and Moir´e 463</p> <p>15.5 Projective Geometry and Projection Moir´e 467</p> <p>15.6 Epipolar Model of the Two Projectors and One Camera System 469</p> <p>15.7 Approaches to Extend the Moir´e Method to More General Conditions of Projection and Observation 471</p> <p>15.8 Summary of the Chapter 482</p> <p>References 482</p> <p><b>16 Moir´e Contouring Applications 485</b></p> <p>16.1 Introduction 485</p> <p>16.2 Basic Principles of Optical Contouring Measuring Devices 486</p> <p>16.3 Contouring Methods that Utilize Projected Carriers 486</p> <p>16.4 Parallax Determination in an Area 489</p> <p>16.5 Mathematical Modeling of the Parallax Determination in an Area 490</p> <p>16.6 Limitations of the Contouring Model 492</p> <p>16.7 Applications of the Contouring Methods 494</p> <p>16.8 Double Projector System with Slope and Depth-of-Focus Corrections 506</p> <p>16.9 Sensitivity Limits for Contouring Methods 518</p> <p>References 520</p> <p><b>17 Reflection Moir´e 523</b></p> <p>17.1 Introduction 523</p> <p>17.2 Incoherent Illumination. Derivation of the Fundamental Relationship 523</p> <p>17.3 Interferometric Reflection Moir´e 526</p> <p>17.4 Analysis of the Sensitivity that can be Achieved with the Described Setups 530</p> <p>17.5 Determination of the Deflection of Surfaces Using Reflection Moir´e 531</p> <p>17.6 Applications of the Reflection Moir´e Method 532</p> <p>17.7 Reflection Moir´e Application – Analysis of a Shell 539</p> <p>References 545</p> <p><b>18 Speckle Patterns and Their Properties 547</b></p> <p>18.1 Introduction 547</p> <p>18.2 First Order Statistics 550</p> <p>18.3 Three Dimensional Structure of Speckle Patterns 558</p> <p>18.4 Sensor Effect on Speckle Statistics 560</p> <p>18.5 Utilization of Speckles to Measure Displacements. Speckle Interferometry 562</p> <p>18.6 Decorrelation Phenomena 564</p> <p>18.7 Model for the Formation of the Interference Fringes 567</p> <p>18.8 Integrated Regime. Metaspeckle 569</p> <p>18.9 Sensitivity Vector 572</p> <p>18.10 Speckle Techniques Set-Ups 573</p> <p>18.11 Out-of-Plane Interferometer 576</p> <p>18.12 Shear Interferometry (Shearography) 577</p> <p>18.13 Contouring Interferometer 578</p> <p>18.14 Double Viewing. Duffy Double Aperture Method 579</p> <p>References 581</p> <p><b>19 Speckle 2 583</b></p> <p>19.1 Speckle Photography 583</p> <p>19.2 Point-Wise Observation of the Speckle Field 584</p> <p>19.3 Global View 585</p> <p>19.4 Different Set-Ups for Speckle Photography 589</p> <p>19.5 Applications of Speckle Interferometry 590</p> <p>19.6 High Temperature Strain Measurement 593</p> <p>19.7 Four Beam Interferometer Sensitive to in Plane Displacements 597</p> <p>References 606</p> <p><b>20 Digital Image Correlation (DIC) 607</b></p> <p>20.1 Introduction 607</p> <p>20.2 Process to Obtain the Displacement Information 608</p> <p>20.3 Basic Formulation of the Problem 610</p> <p>20.4 Introduction of Smoothing Functions to Solve the Optimization Problem 613</p> <p>20.5 Determination of the Components of the Displacement Vector 618</p> <p>20.6 Important Factors that Influence the Packages of DIC 619</p> <p>20.7 Evaluation of the DIC Method 621</p> <p>20.8 Double Viewing DIC. Stereo Vision 627</p> <p>References 628</p> <p><b>21 Holographic Interferometry 631</b></p> <p>21.1 Holography 631</p> <p>21.2 Basic Elements of the Holographic Process 632</p> <p>21.3 Properties of Holograms 634</p> <p>21.4 Set up to Record Holograms 636</p> <p>21.5 Holographic Interferometry 641</p> <p>21.6 Derivation of the Equation of the Sensitivity Vector 644</p> <p>21.7 Measuring Displacements 646</p> <p>21.8 Holographic Moir´e 651</p> <p>21.9 Lens Holography 658</p> <p>21.10 Holographic Moir´e. Real Time Observation 661</p> <p>21.11 Displacement Analysis of Curved Surfaces 665</p> <p>21.12 Holographic Contouring 669</p> <p>21.13 Measurement of Displacements in 3D of Transparent Bodies 675</p> <p>21.14 Fiber Optics Version of the Holographic Moir´e System 675</p> <p>References 677</p> <p><b>22 Digital and Dynamic Holography 681</b></p> <p>22.1 Digital Holography 681</p> <p>22.2 Determination of Strains from 3D Holographic Moir´e Interferograms 685</p> <p>22.3 Introduction to Dynamic Holographic Interferometry 689</p> <p>22.4 Vibration Analysis 693</p> <p>22.5 Experimental Set up for Time Average Holography 695</p> <p>22.6 Investigation on Fracture Behavior of Turbine Blades Under Self-Exciting Modes 700</p> <p>22.7 Dynamic Holographic Interferometry. Impact Analysis. Wave Propagation 708</p> <p>22.8 Applications of Dynamic Holographic Interferometry 712</p> <p>References 721</p> <p><b>Index</b> 723</p>
<p>“The book is highly recommended as a textbook in courses of experimental mechanics and can be used as a basis on which the researcher, the student and the practitioner can develop their ideas and promote research and applications of the experimental methods in engineering problems. The connection and interrelation of the various optical techniques is astonishing.”  (<i>Wiley Experimental Techniques journal</i>, 2012)</p>
<p><strong>Cesar & Federico Sciammarella, University of Illinois, USA</strong><br />Cesar A Sciammarella is Adjunct Professor in the Department of Mechanical Engineering, University of Illinois, USA. In the past he has worked as a consultant for companies including: General Motors, Goodyear, Honeywell Corporation, Rand Corporation, Rockwell International, Sundstran, Uniroyal Tires, IBM, Tryodyne, Samsung, Case Corporation. A renowned experimentalist, his research currently focuses on developing techniques in solid mechanics and he has spoken at many conferences and published prolifically in journals which include Strain; Optical Engineering; SEM Conference on Experimental Mechanics and Journal of Strain Analysis for Engineering Design.<br />Federico Sciammarella is Assistant Professor in the Department of Mechanical Engineering, University of Illinois. His research interests centre upon using optical methods for characterization of materials and structures including failure analysis. Over the past five years he has written multiple journal and conference research papers.
Experimental solid mechanics is the study of materials to determine their physical properties. This study might include performing a stress analysis or measuring the extent of displacement, shape, strain and stress which a material suffers under controlled conditions. In the last few years there have been remarkable developments in experimental techniques that measure shape, displacement and strains and these sorts of experiments are increasingly conducted using computational techniques. <p><i>Experimental Mechanics of Solids</i> is a comprehensive introduction to the topics, technologies and methods of experimental mechanics of solids. It begins by establishing the fundamentals of continuum mechanics, explaining key areas such as the equations used, stresses and strains, and two and three dimensional problems. Having laid down the foundations of the topic, the book then moves on to look at specific techniques and technologies with emphasis on the most recent developments such as optics and image processing. Most of the current computational methods, as well as practical ones, are included to ensure that the book provides information essential to the reader in practical or research applications.</p> <p>Key features:</p> <ul> <li>Presents widely used and accepted methodologies that are based on research and development work of the lead author </li> <li>Systematically works through the topics and theories of experimental mechanics including detailed treatments of the Moire, Speckle and holographic optical methods </li> <li>Includes illustrations and diagrams to illuminate the topic clearly for the reader </li> <li>Provides a comprehensive introduction to the topic, and also acts as a quick reference guide </li> <li>Accompanied by a website <a href="http://www.wiley.com/go/sciammarella">www.wiley.com/go/sciammarella</a> hosting problems and solutions.</li> </ul> <p>This comprehensive book forms an invaluable resource for graduate students and is also a point of reference for researchers and practitioners in structural and materials engineering.</p>

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