Details

Harsh Environment Electronics

Interconnect Materials and Performance Assessment
1. Aufl.

von: Ahmed Sharif
144,99 €
Verlag:	Wiley-VCH
Format:	EPUB
Veröffentl.:	09.04.2019
ISBN/EAN:	9783527813971
Sprache:	englisch
Anzahl Seiten:	400

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Beschreibungen

Titelbeschreibung

Provides in-depth knowledge on novel materials that make electronics work under high-temperature and high-pressure conditions This book reviews the state of the art in research and development of lead-free interconnect materials for electronic packaging technology. It identifies the technical barriers to the development and manufacture of high-temperature interconnect materials to investigate into the complexities introduced by harsh conditions. It teaches the techniques adopted and the possible alternatives of interconnect materials to cope with the impacts of extreme temperatures for implementing at industrial scale. The book also examines the application of nanomaterials, current trends within the topic area, and the potential environmental impacts of material usage. Written by world-renowned experts from academia and industry, Harsh Environment Electronics: Interconnect Materials and Performance Assessment covers interconnect materials based on silver, gold, and zinc alloys as well as advanced approaches utilizing polymers and nanomaterials in the first section. The second part is devoted to the performance assessment of the different interconnect materials and their respective environmental impact. -Takes a scientific approach to analyzing and addressing the issues related to interconnect materials involved in high temperature electronics -Reviews all relevant materials used in interconnect technology as well as alternative approaches otherwise neglected in other literature -Highlights emergent research and theoretical concepts in the implementation of different materials in soldering and die-attach applications -Covers wide-bandgap semiconductor device technologies for high temperature and harsh environment applications, transient liquid phase bonding, glass frit based die attach solution for harsh environment, and more -A pivotal reference for professionals, engineers, students, and researchers Harsh Environment Electronics: Interconnect Materials and Performance Assessment is aimed at materials scientists, electrical engineers, and semiconductor physicists, and treats this specialized topic with breadth and depth.

Inhaltsverzeichnis

Preface xv 1 Wide-Bandgap Semiconductor Device Technologies for High-Temperature and Harsh Environment Applications 1 Md. Rafiqul Islam, Roisul H. Galib,Montajar Sarkar, and Shaestagir Chowdhury 1.1 Introduction 1 1.2 Crystal Structures and Fundamental Properties of Different Wide-Bandgap Semiconductors 3 1.2.1 Relevant Properties of GaN, SiC, and Si 3 1.2.2 Structure of SiC 3 1.2.2.1 Polytypism in SiC 3 1.2.2.2 Modification of SiC Structures with Dopant 6 1.2.3 III–V Nitride-Based Structure 6 1.2.3.1 Fundamental Properties of GaN and AlN 7 1.2.3.2 Nitride Crystal Growth 7 1.2.3.3 Polytypism in the III–V Nitrides 8 1.2.3.4 Electrical Properties of Undoped Nitride Thin films 9 1.2.3.5 Properties of Doped GaN 9 1.2.4 Alloys and Heterostructures 10 1.2.4.1 GaInN 10 1.3 Devices ofWide-Bandgap Semiconductors 10 1.3.1 SiC in Junction Field-Effect Transistors (JFETs) 10 1.3.1.1 Specific Contact Resistance (𝜌c) 11 1.3.2 SiC in Metal Oxide Semiconductor Field-Effect Transistors (MOSFETs) 12 1.3.2.1 1200-V, 60-A SiC Power Module MOSFET 12 1.3.2.2 Design of the 1200-V, 60-A Phase-leg Module 13 1.3.2.3 Blocking Capability 14 1.3.2.4 Static Characteristics 15 1.3.2.5 Transfer Characteristics 15 1.3.2.6 Evaluation of the Gate Oxide Stability 16 1.3.3 Six-Pack SiC MOSFET Modules Paralleled in a Half-Bridge Configuration 16 1.3.4 4H-SiC Metal Semiconductor Field-Effect Transistor (MESFET) for Integrated Circuits (ICs) 18 1.3.4.1 Design of 4H-SiC MESFET 18 1.3.4.2 I–V Characteristics 19 1.3.5 SiC Capacitive Pressure Sensor 20 1.3.5.1 Sensor Characteristics at High Temperature 21 1.3.6 Ni2+-doped ZnO as Diluted Magnetic Semiconductors (DMSs) 22 1.3.6.1 Saturation Magnetization (Ms) at High Temperatures 22 1.3.6.2 The Coercivity (Hc) and Effective MagneticMoment (𝜇eff) at High Temperatures 23 1.3.7 Thermomechanical Stability of SiC, GaN, AlN, ZnO, and ZnSe 24 1.4 Conclusion 25 References 26 2 High-Temperature Lead-free Solder Materials and Applications 31 Mohd F. M. Sabri, Bakhtiar Ali, and Suhana M. Said 2.1 Introduction 31 2.2 High-Temperature Solder Applications 32 2.2.1 Die-Attach Material 32 2.2.2 BGA Technology 33 2.2.3 Flip-Chip Technology 34 2.2.4 MCM Technology 34 2.2.5 CSP Technology 35 2.3 Requirements for a Candidate Solder in High-temperature Applications 35 2.4 High-Pb-Content Solders 37 2.5 Zn-Based Solders 38 2.5.1 Zn–Al 38 2.5.2 Zn–Sn 39 2.6 Bi-Based Solders 42 2.6.1 Bi–Ag 42 2.6.2 Bi–Sb 44 2.7 Au-Based Solders 47 2.7.1 Au–Sn 47 2.7.2 Au–Ge 49 2.8 Sn-Based Solders 51 2.8.1 Sn–Sb 51 2.8.2 Sn–Ag–Cu/Sn–Cu/Sn–Ag 53 2.9 Conclusion and Future Research Directions 56 References 60 3 Role of Alloying Addition in Zn-Based Pb-Free Solders 67 Khairul Islam and Ahmed Sharif 3.1 Introduction 67 3.2 Zn-Al-Based Solders 68 3.3 Zn–Sn-Based Solders 75 3.4 Zn-Based Alloys with Minor Addition 80 3.5 Zn–Ni-Based Solders 81 3.6 Zn–Mg-Based Solders 82 3.7 Zn–In-Based Solders 83 3.8 Zn–Ag-Based Solders 84 3.9 Conclusion 84 Acknowledgment 85 References 85 4 Effect of Cooling Rate on the Microstructure, Mechanical Properties, and Creep Resistance of a Cast Zn–Al–Mg High-temperature Lead-Free Solder Alloy 91 Reza Mahmudi, Davood Farasheh, and Seyyed S. Biriaie 4.1 Introduction 91 4.2 Experimental Procedures 93 4.2.1 Materials and Processing 93 4.2.2 Mechanical Property Measurements 93 4.3 Results and Discussion 94 4.3.1 Shear Strength and Hardness 94 4.3.2 Microstructural Observations 97 4.3.3 Impression Creep 100 4.3.4 Creep Mechanisms 103 4.3.5 Microstructure–Property Relationships 110 4.4 Conclusions 111 References 112 5 Development of Zn–Al–xNi Lead-Free Solders for High-Temperature Applications 115 Sanjoy Mallick, Md Sharear Kabir, and Ahmed Sharif 5.1 Introduction 115 5.2 Experimental 116 5.3 Results and Discussions 118 5.4 Conclusions 130 Acknowledgments 131 References 131 6 Study of Zn–Mg–Ag High-Temperature Solder Alloys 135 Roisul H. Galib, Md. Ashif Anwar, and Ahmed Sharif 6.1 Introduction 135 6.2 Materials and Methods 136 6.3 Results and Discussions 137 6.3.1 Chemical Composition 137 6.3.2 Microstructural Analysis 137 6.3.3 Mechanical Properties 141 6.3.4 Electrical Properties 142 6.3.5 Thermal Properties 142 6.4 Conclusions 143 Acknowledgments 144 References 144 7 Characterization of Zn–Mo and Zn–Cr Pb-Free Composite Solders as a Potential Replacement for Pb-Containing Solders 147 Khairul Islam and Ahmed Sharif 7.1 Introduction 147 7.2 Experimental 149 7.3 Results and Discussion 150 7.3.1 Zn–xMo System 150 7.3.1.1 Differential Thermal Analysis (DTA) 150 7.3.1.2 Microstructure of Zn–xMo System 151 7.3.1.3 Brinell Hardness 153 7.3.1.4 Tensile Strength 153 7.3.1.5 Tensile Fracture Surface Analysis 154 7.3.1.6 TMA Analysis 154 7.3.1.7 Electrical Conductivity Analysis 156 7.3.2 Zn–xCr System 156 7.3.2.1 Differential Thermal Analysis 156 7.3.2.2 Microstructure of Zn–xCr System 157 7.3.2.3 Brinell Hardness 158 7.3.2.4 Tensile Strength 159 7.3.2.5 Fracture Surface Analysis 160 7.3.2.6 TMA Analysis 160 7.3.2.7 Electrical Conductivity Analysis 162 7.3.3 Comparison of Zn–xMo and Zn–xCr Solders with Conventional Solders 162 7.4 Conclusion 163 Acknowledgments 163 References 164 8 Gold-Based Interconnect Systems for High-Temperature and Harsh Environments 167 Ayesha Akter, Ahmed Sharif, and Rubayyat Mahbub 8.1 Introduction 167 8.2 High-Temperature Solder System 168 8.2.1 Au as High-Temperature Solder 169 8.3 Various Au-Based Solder Systems 169 8.3.1 Au–Sn System 170 8.3.1.1 Au-Rich Side of the Au–Sn System 171 8.3.1.2 Sn-Rich Side of the Au–Sn System 172 8.3.2 Au–Ge System 174 8.3.3 Au–In System 176 8.3.4 Au–Si System 177 8.4 Other Interconnecting Systems 178 8.4.1 Wire Bonding 178 8.4.2 Au-enriched SLID 179 8.4.3 Nanoparticle-Stabilized Composite Solder 180 8.4.4 Solderable Coatings 181 8.5 Applications 182 8.5.1 Electronic Connectors 182 8.5.2 Optoelectronic Connectors 182 8.5.3 Medical Field 183 8.5.4 Jewelry 183 8.5.5 Au Stud Bump 184 8.6 Substitutes for Au and Reductions in Use 184 8.7 Future Uses of Au 185 8.8 Conclusions 185 Acknowledgments 185 References 185 9 Bi-Based Interconnect Systems and Applications 191 Manifa Noor and Ahmed Sharif 9.1 Introduction 191 9.2 Various Bi-Based Solder Systems 192 9.2.1 Bi–Ag Alloys 192 9.2.2 Bi–Sb Alloy 196 9.2.3 Bi–Sb–Cu Alloy 198 9.2.4 Bi–Cu-Based Alloys 199 9.2.5 Bi–Sn 201 9.2.6 Bi–La 204 9.2.7 Bi-Based Transient Liquid Phase Bonding 204 9.2.8 Bi-Based Composite System 205 9.3 Conclusion 206 Acknowledgments 206 References 206 10 Recent Advancement of Research in Silver-Based Solder Alloys 211 Ahmed Sharif 10.1 Introduction 211 10.2 Overview of Different Ag-Based Systems 213 10.2.1 Ag Pastes 213 10.2.1.1 Micron-Ag Paste 213 10.2.1.2 Nano-Ag Paste 215 10.2.1.3 Hybrid Silver Pastes 216 10.2.1.4 Ag-Based Bimetallic Paste 217 10.2.1.5 Composite Micron-Ag Pastes 218 10.2.2 Ag Laminates 219 10.2.3 Plated Ag 219 10.2.4 Silver Foil 220 10.2.5 Ag Columns 222 10.2.6 Ag–In System 223 10.3 Conclusions 223 Acknowledgments 224 References 224 11 Silver Nanoparticles as Interconnect Materials 235 Md. Ashif Anwar, Roisul Hasan Galib, and Ahmed Sharif 11.1 Introduction 235 11.2 Synthesis of Ag Nanoparticles 236 11.2.1 Carey Lea’s Colloidal 236 11.2.2 e-Beam IrradiationMethod 237 11.2.3 Chemical Reduction Method 237 11.2.4 Thermal Decomposition Method 238 11.2.5 Laser Ablation Method 239 11.2.6 Microwave Radiation Method 239 11.2.7 Solid–Liquid Extraction Method 240 11.2.8 Tollens Method 240 11.2.9 Biological Method 241 11.2.10 Polyoxometalate Method 241 11.2.11 Solvated Metal Atom Dispersion Method 241 11.3 Composition of Ag Nanopaste 241 11.4 Joining Methods 242 11.5 Properties of Nano-Ag Joints 243 11.5.1 Shear Properties of Nano-Ag Joints 245 11.5.2 Thermal Properties 246 11.5.3 Rheological Properties 247 11.6 Factors Affecting the Properties of Nano-Ag Joints 248 11.6.1 Particle Size and Composition of the Paste 248 11.6.2 Effect of Sintering Temperature, Time, and Pressure on Ag Joints 252 11.6.3 Bonding Substrate 254 11.7 Applications of Ag Nanoparticles 255 11.7.1 Die-Attach Material 255 11.7.2 Solar Cell 255 11.7.3 Nano-Ag as a Potent Bactericidal Agent 256 11.7.4 Nano-Ag in Antifungal Therapy 256 11.8 Conclusions and Future Trends 257 References 257 12 Transient Liquid Phase Bonding 263 Tariq Islam and Ahmed Sharif 12.1 Introduction 263 12.2 History and Development of TLP 264 12.3 Theoretical Aspects of TLP 266 12.3.1 TLP Process, Types, and Relevance with Phase Diagram 266 12.3.2 Classification of TLP Bonding Based on Interlayer Composition 272 12.3.3 Variants of TLP Bonding 272 12.4 Development and Applicable Trends of TLP Using Alloy Systems (Phase Diagrams) with Special Features 273 12.4.1 Cu–Sn System 273 12.4.2 Ni–Sn System 276 12.4.3 Ag–Sn System 280 12.4.4 Au–Sn System 281 12.4.5 Miscellaneous Systems 283 12.4.5.1 Cu–Ga System 283 12.4.5.2 Au–(Ge, Si) System 284 12.5 Applications and Materials Used in TLPB 284 12.6 Future of TLP and Conclusion 285 References 285 13 All-Copper Interconnects for High-Temperature Applications 293 Ahmed Sharif 13.1 Introduction 293 13.2 Direct Cu-to-Cu Bonding 294 13.2.1 Thermocompression Bonding 294 13.2.2 Surface-Activated Bonding (SAB) 296 13.2.3 Self-Assembled Monolayers (SAMs) 296 13.2.4 Capping with Metal Layer 297 13.3 Cu Paste Bonding 299 13.3.1 Cu Nanoparticle (Cu NP) 299 13.3.1.1 Bonding with Cu NP Under Pressure 299 13.3.1.2 Cu NP Bonding Without Pressure 301 13.3.2 Cu Microparticles 301 13.3.3 Cu Hybrid Particles 303 13.3.4 Cu–Sn TLP System 303 13.3.5 Cu–Ag Composite Systems 304 13.4 Conclusions 306 Acknowledgments 306 References 306 14 Glass-Frit-Based Die-Attach Solution for Harsh Environments 313| Ahmed Sharif 14.1 Introduction 313 14.1.1 Basic Criteria of the Glass Composition for Glass Frit 314 14.2 Overview of Different Glass Frit Systems 315 14.2.1 Pb-Containing Glass Frit 316 14.2.2 Pb-Free Glass Frit 316 14.2.2.1 Borosilicate Glasses 317 14.2.2.2 Phosphate Glasses 318 14.2.2.3 Bi-Based Lead-Free Frit 319 14.2.2.4 Vanadate Glasses 319 14.2.2.5 Tellurite Glasses 319 14.2.3 Conductive Glass Frit 320 14.3 Bonding Process 320 14.4 Bond Characteristics 322 14.5 Conclusions 324 Acknowledgments 325 References 325 15 Carbon-Nanotube-Reinforced Solders as Thermal Interface Materials 333 Md Muktadir Billah 15.1 Introduction 333 15.2 Typical Thermal Interface Materials 334 15.3 Solders as Thermal Interface Materials 334 15.4 Literature Study: Different Fabrication Techniques 336 15.4.1 Mechanical Alloying/Sonication and Sintering 336 15.4.2 Reflow Process 338 15.4.3 Electrochemical Co-deposition Method 339 15.4.4 Using Metal-Coated Nanotubes 339 15.4.5 Sandwich Method 341 15.4.6 Melting Route 341 15.5 Challenges and Future Scope 342 References 342 16 Reliability Study of Solder Joints in Electronic Packaging Technology 345 Ahmed Sharif and Sushmita Majumder 16.1 Introduction 345 16.2 Reliability Tests 346 16.2.1 Destructive Shear Test 346 16.2.2 Pull Test 347 16.2.3 Bending Test 348 16.2.4 Board-Level Drop Test 349 16.2.5 Thermal Cycling 351 16.2.6 Shock Impact 354 16.2.7 Fatigue Test 355 16.2.8 Pressure Cooker Test 356 16.2.9 Thermal Shock Testing 357 16.2.10 Acoustic Microscopy 358 16.2.11 Thermography 358 16.2.12 X-ray Computed Tomography 359 16.3 Conclusion 360 Acknowledgments 360 References 361 Index 367

Autorenportrait

Ahmed Sharif, PhD, has been working as faculty in the Department of Materials and Metallurgical Engineering at the Bangladesh University of Engineering and Technology since 1999. He is an international renowned scientist in joining technology, and has published more than fifty peer-reviewed papers in leading international journals in soldering and ferroelectric materials research. A part of his PhD research has led to the award of an international prize, the "IEEE CPMT Young Scientist Award", for his paper presentation in an IEEE conference held in Japan in 2004.

Back cover copy

Provides in-depth knowledge on novel materials that make electronics work under high-temperature and high-pressure conditions This book reviews the state of the art in research and development of lead-free interconnect materials for electronic packaging technology. It identifies the technical barriers to the development and manufacturing of high-temperature interconnect materials, with a particular focus on the complexities introduced by harsh conditions. It also discusses the techniques to cope with the impact of extreme temperatures when implementing manufacturing processes at an industrial scale. Furthermore, the book examines the application of nanomaterials, current trends within the topical area, and the potential environmental impacts of material usage. Written by world-renowned experts from academia and industry, Harsh Environment Electronics: Interconnect Materials and Performance Assessment covers interconnect materials based on silver, gold, and zinc alloys as well as advanced approaches utilizing polymers and nanomaterials in the first section. The second part is devoted to the performance assessment of the different interconnect materials and their respective environmental impact. <ul> <li>Takes a scientific approach to analyzing and addressing the issues related to interconnect materials involved in high temperature electronics</li> <li>Reviews all relevant materials used in interconnect technology as well as alternative approaches</li> <li>Highlights emergent research and theoretical concepts in the implementation of different materials in soldering and die-attach applications</li> <li>Covers wide-bandgap semiconductor device technologies for high-temperature and harsh environment applications, transient liquid phase bonding, glass frit based die attach solution for harsh environment, and more</li> <li>A pivotal reference for professionals, engineers, students, and researchers</li> </ul> Harsh Environment Electronics: Interconnect Materials and Performance Assessment is aimed at materials scientists, electrical engineers, and semiconductor physicists, and treats this specialized topic with breadth and depth.